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Contactless VLSI Measurement and Testing Techniques

By (author) Selahattin Sayil
Format: Hardback
Publisher: Springer International Publishing AG, Cham, Switzerland
Published: 4th Dec 2017
Dimensions: w 155mm h 235mm
Weight: 454g
ISBN-10: 3319696726
ISBN-13: 9783319696720
Barcode No: 9783319696720
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Synopsis
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

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