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Computational Intelligence-based Testing for Robust Circuit Design

Ausgewahlte Probleme Der Elektronik Und Mikromechatronik S. v. 22

By (author) Chee Hong Liau
Format: Paperback
Publisher: Shaker Verlag GmbH, Germany, Aachen, Germany
Published: 15th Sep 2006
Dimensions: w 148mm h 210mm
ISBN-10: 3832254358
ISBN-13: 9783832254353
Barcode No: 9783832254353
ISSN: 1618-7539

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