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Design, Analysis and Test of Logic Circuits Under Uncertainty

Lecture Notes in Electrical Engineering 115

Format: Paperback / softback
Publisher: Springer, Dordrecht, Netherlands
Published: 15th Oct 2014
Dimensions: w 156mm h 234mm d 7mm
Weight: 202g
ISBN-10: 9400797982
ISBN-13: 9789400797987
Barcode No: 9789400797987
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Synopsis
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

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