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High Resolution Electron and Ion Microscopy

UKAEA Conference on Materials Analysis by Physical Techniques, Springfields Nuclear Laboratories, 11-13 November 1986

By (author) B.A. Bellamy
Format: Paperback
Publisher: AEA Technology, Didcot, United Kingdom
Published: 31st Dec 1987
Dimensions: h 300mm
ISBN-10: 0705811859
ISBN-13: 9780705811859
Barcode No: 9780705811859

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