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Proceedings of the International Symposium for Testing and Failure Analysis

Format: Paperback
Publisher: ASM International, Ohio, United States
Published: 30th Nov 1992
Dimensions: h 280mm
ISBN-10: 0871704560
ISBN-13: 9780871704566
Barcode No: 9780871704566
The symposium was held in Los Angeles, October 1992. Among the topics: microsectioning techniques, defect characterization, passive-component analysis, failure simulation and replication, analytical equipment, acoustic microscopy techniques, product capability and applications, and failure mechanisms. No index. Member price $75.20. Annotation copyr

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