Your price
Out of Stock

Low Temperature Silicon Epitaxy: Defects and Electronic Properties

Berichte Aus Der Halbleitertechnik

By (author) Thomas Wagner
Format: Paperback
Publisher: Shaker Verlag GmbH, Germany, Aachen, Germany
Published: 21st Aug 2003
Dimensions: w 148mm h 210mm
ISBN-10: 3832218076
ISBN-13: 9783832218072
Barcode No: 9783832218072
ISSN: 0945-0785

New & Used

Seller Information Condition Price
Out of Stock

What Reviewers Are Saying

Be the first to review this item. Submit your review now