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Reliability Investigations and Development of Compound Semiconductor Devices for Microwave and Terahertz Applications

Berichte aus der Elektrotechnik

By (author) Cezary Sydlo
Format: Paperback
Publisher: Shaker Verlag GmbH, Germany, Aachen, Germany
Published: 5th Sep 2006
Dimensions: w 148mm h 210mm
ISBN-10: 3832254005
ISBN-13: 9783832254001
Barcode No: 9783832254001
ISSN: 0945-0718

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