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Residual Stresses

A Review of Their Measurement and Interpretation Using X-Ray Diffraction. Reports S.

By (author) A.M. Jones
Format: Paperback
Publisher: AEA Technology, Didcot, United Kingdom
Published: 31st Dec 1989
Dimensions: h 300mm
ISBN-10: 0705815226
ISBN-13: 9780705815222
Barcode No: 9780705815222

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