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Semiconductor Materials

Characterisation Techniques

Edited by P.R. Vaya
Format: Hardback
Publisher: Narosa Publishing House, New Delhi, India
Published: 30th Sep 1994
Dimensions: h 230mm
ISBN-10: 8173190038
ISBN-13: 9788173190032
Barcode No: 9788173190032
In this work, scientists working in the field of semiconductor materials discuss the latest and the emerging techniques of characterization. Topics covered include: ellipsometry; transmission electron microscopy; X-ray photoelectron spectroscopy; and electro-optic devices.

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