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Transient Ion Beam Induced Charge/currents Microscopy on High Power Semiconductor Devices

Berichte aus der Energietechnik

By (author) Markus Zmeck
Format: Paperback
Publisher: Shaker Verlag GmbH, Germany, Aachen, Germany
Published: 7th Dec 2004
Dimensions: w 148mm h 210mm
ISBN-10: 3832234284
ISBN-13: 9783832234287
Barcode No: 9783832234287
ISSN: 0945-0726

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