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Transmission Electron Microscopy of Silicon Very Large Scale Integration Circuits and Structures

By (author) R. B. Marcus, T.T. Sheng
Format: Hardback
Publisher: John Wiley and Sons Ltd, New York, United States
Imprint: John Wiley & Sons Inc
Published: 16th Nov 1983
Dimensions: w 220mm h 290mm
Weight: 1049g
ISBN-10: 0471092517
ISBN-13: 9780471092513
Barcode No: 9780471092513

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